Freescale-semiconductor ColdFire MCF52210 Uživatelský manuál stáhnout pdf (Strana 551)

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101

IEEE 1149.1 Test Access Port (JTAG)

MCF52211 ColdFire® Integrated Microcontroller Reference Manual, Rev. 2

Freescale Semiconductor 29-7

Figure 29-4. TAP Controller State Machine Flow

29.4.3 JTAG Instructions

Table 29-5 describes public and private instructions.

Table 29-5. JTAG Instructions

Instruction IR[3:0] Instruction Summary

EXTEST 0000 Selects boundary scan register while applying fixed values to output pins and

asserting functional reset

IDCODE 0001 Selects IDCODE register for shift

SAMPLE/PRELOAD 0010 Selects boundary scan register for shifting, sampling, and preloading without

disturbing functional operation

ENABLE_TEST_CTRL 0110 Selects TEST_CTRL register

RUN-TEST/IDLE

TEST-LOGIC-RESET

SELECT DR-SCAN

CAPTURE-DR

EXIT1-DR

PAUSE-DR

UPDATE-DR

SELECT IR-SCAN

SHIFT-DR

EXIT2-DR

CAPTURE-IR

SHIFT-IR

EXIT1-IR

PAUSE-IR

EXIT2-IR

UPDATE-IR

1 2 ... 546 547 548 549 550 551 552 553 554 555 556 ... 575 576

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